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  • XPS studies of surface damages of transition metal fluorosilicates under argon ion bombardment
  • Add time:07/27/2019         Source:sciencedirect.com

    Radiation damages to the surfaces of transition metal fluorosilicates under l keV argon ion bombardment have been investigated by photoelectron spectroscopy. The damage sequences appear to be related to the inertness of the metal as well as the single valence states of Si and F. Near the middle of the transition series (FeSiF6), and for the d10 closed shell configuration (ZnSiF6), there is direct decomposition into the highly stable metal fluoride with the concomittant loss of the volatile SiF4. Thus, we observe the disappearance of Si 2p peak but not the F ls peak under prolonged ion bombardment. In contrast, near the end of the transition series, (Cu, Ni, Co)SiF6, where the metal is more inert, the cation and anion behave essentially as separate entities. Whereas the reduction of cation to metal occurs rather quickly (∼ 5 × 1017 ions/cm2), the decomposition of the anion into volatile components (SiF4 and F2) occur considerably later (∼ 60 × 1017 ions/cm2). Experimentally we observe the disappearance of both Si and F peaks. On the other hand, no radiation damage was observed on either alkali or alkaline earth fluorosilicates (Na2SiF6, K2SiF6, CaSiF6) where the 3d electrons are absent. Thus the resistance to radiation damage may be related to the absence of 3d electrons as well as to the single valence states of Si and F. These results underscore the chemical nature of surface damages under ion bombardment.

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