Add time:08/11/2019         Source:sciencedirect.com

LANTHANUM SULFIDE (cas 12325-81-4) thin films were prepared on glass substrates from aqueous medium using spray pyrolysis technique. The effect of preparative parameters such as substrate temperature and solution concentration on the films was studied. The lanthanum sulfide films were annealed in air at 300 °C for 2 h. The films were characterized by X-ray diffraction (XRD), optical microscopy, optical absorption, electrical resistivity and thermo-emf measurement techniques. The XRD studies revealed that the as deposited films are amorphous, while annealed films are polycrystalline. The optical band gap of the as deposited film is decreased from 2.5 to 2.2 eV after annealing due to improvement in crystallinity. The electrical resistivity is of the order of 104–105 Ω cm and showed semiconducting behaviour. Thermo-emf measurement revealed that the conductivity of lanthanum sulfide is p-type.

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