Add time:08/14/2019         Source:sciencedirect.com

Aqueous solutions of perfluorinated sulfonic acid (PFSA) ionomers and their side chain model compounds were irradiated with cobalt-60 gamma rays and their reaction products were analyzed by ion chromatography, liquid chromatography with mass spectrometry, and nuclear magnetic resonance spectroscopy. Radiolytic yields of fluoride and sulfate anions from trifluoromethane sulfonate (TFMS) were very low and attributed to a direct effect. The higher degradation rate of perfluoro-2-ethoxyethane-sulfonate (PFEES) in N2O-saturated samples compared with those under air saturation was attributed to an impurity containing a hydrogen atom. The intrinsic reactivity of PFEES toward hydroxyl was comparable to TFMS. Degradation products retaining the side chain structure were detected after gamma irradiation of long and short side chain PFSA ionomers. Based on the low reactivity of the side chain model compounds and the absence of an N2O saturation effect, dissociative electron attachment likely is responsible for their formation after the direct effect of ionizing radiation on the PFSA ionomers.

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