Add time:08/29/2019         Source:sciencedirect.com

X-ray reflectivity is used to study the interfacial structure of liquid Squalane (cas 111-01-3) on SiO2/Si(1 0 0) substrates. The data show that there are density oscillations (‘layers’) near the interface, with the squalane molecular long axes parallel to the substrate. The results are compared to those from molecular dynamics simulations and recent force measurements.

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