Add time:09/03/2019         Source:sciencedirect.com

We measure the evolution of the optical transmission (200–760 nm) and the electrical resistivity of Ho films, 50 nm thick, as a function of H concentration up to 2.9 [H]/[Ho]. The Ho films are covered with a 15 nm thick Pd overcoat for hydrogenation and ex situ measurements. Concentration is measured using a quartz crystal microbalance; the films are deposited in a high vacuum chamber and all measurements are made at room temperature. From the measured transmission spectra, using an inversion method, the complex refraction index of the Ho film is determined; from it the dielectric function, ɛ = ɛ1 + iɛ2, is calculated. This procedure is applied to the hydrogenated Pd coated Ho films finding the evolution of ɛ as a function of hydrogen concentration. Furthermore, using the inversion method in the trihydrided films the plasma frequency and the band gap are calculated.

We also recommend Trading Suppliers and Manufacturers of HOLMIUM HYDRIDE (cas 13598-41-9). Pls Click Website Link as below: cas 13598-41-9 suppliers