Encyclopedia

  • Research ArticleConfining effect of oxide film on tin whisker growth
  • Add time:08/30/2019         Source:sciencedirect.com

    Spontaneous tin whisker growth has been mysterious and catastrophic for more than half century. The difficulty in the research on this topic consists of the randomness of the whisker growth, the slow growth rate and many other tricky factors. Herein, with Ti2SnC-Sn as a new platform, fast tin whisker growth is realized to facilitate the research. The whisker morphology is found to be modulated by oxide film. A striated whisker morphology forms as growing in air, whereas a faceted morphology forms in vacuum. Furthermore, the evolution to the faceted morphology is attributed to the reconstruction of the whisker surface driven by surface energy reduction. The findings might open a new avenue to uncover the myths of this long-standing issue, and thus develop a long-awaited lead-free tin whisker mitigation strategy.

    We also recommend Trading Suppliers and Manufacturers of LEAD TIN OXIDE (cas 1344-41-8). Pls Click Website Link as below: cas 1344-41-8 suppliers


    Prev:Original ArticleSynthesis and characterization of PrxZr1-xSiO4 (x = 0–0.08) yellow pigments via non-hydrolytic sol-gel method
    Next: Compared the oxidation behavior of TiN and TiN/W2N ceramic coatings during heat treatment)

About|Contact|Cas|Product Name|Molecular|Country|Encyclopedia

Message|New Cas|MSDS|Service|Advertisement|CAS DataBase|Article Data|Manufacturers | Chemical Catalog

©2008 LookChem.com,License: ICP

NO.:Zhejiang16009103

complaints:service@lookchem.com Desktop View