Add time:07/31/2019         Source:sciencedirect.com

Thin chromium and tellurium superlattice reactants with individual layer thickness ranging from a few Angstrom to thousands of Angstrom were deposited on (100)-Si substrate and the reactions were investigated with ex-situ and in-situ X-ray powder diffraction and X-ray reflectometry. The number of layers was adjusted between 3 and 653 and the compositions of the films ranged from 71 to 86 at% Te. Samples with thick Cr/Te double-layers (300–3000 Å) react at about 300°C to form crystalline and highly textured (h00)-CrTe3. The temperature of formation is dramatically reduced to 100°C using Cr–Te multi-layers exhibiting Cr/Te double-layers with a thickness below 25 Å. At about 275°C (h00)-CrTe3 is decomposed followed by the crystallisation of Cr2Te3 which also crystallises as a highly oriented material with a (00l)-texture. In a narrow temperature range both compounds coexist. The decomposition of the monochromium tritelluride followed by the crystallisation of Cr2Te3 could only be observed using the thin film samples whereas for the thick superlattices no such decomposition could be observed. We also show the very detailed analysis of a sample containing 6 Cr/Te double-layers. The results obtained with different analytical techniques like energy dispersive X-ray spectroscopy, atomic force microscopy, transmission electron microscopy, and X-ray reflectometry lead to a very comprehensive picture of the multi-layer structure of this sample.

We also recommend Trading Suppliers and Manufacturers of CHROMIUM TELLURIDE (cas 12053-39-3). Pls Click Website Link as below: cas 12053-39-3 suppliers