Add time:07/28/2019         Source:sciencedirect.com

Thin films of LaSi2 − x, prepared by solid phase reaction of La with Si substrates in vacuum, have been studied using X-ray diffraction and electron microscopy. Their electrical resistivity was measured as a function of temperature from 1.6 to 300 K. The LaSi2 − x layers were found to be metallic with a superconductive transition at 2–5 K.

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